T.P. Smith III, K.Y. Lee, et al.
Physical Review B
A new semiconductor-insulator-semiconductor field-effect transistor has been fabricated. The device consists of a heavily doped n-type GaAs gate with undoped (Al,Ga)As as the gate insulator, on an undoped GaAs layer. This structure gives the device a natural threshold voltage near zero, well suited for low-voltage logic. The threshold voltage is, to first order, independent of Al mole fraction and thickness of the (Al,Ga)As layer. The layers were grown by MBE and devices fabricated using a self-aligned technique involving ion-implantation and rapid thermal annealing. A transconductance of 240 mS/mm and a field-effect mobility of about 100 000 cm2/V-s were achieved at 77 K. Copyright © 1984 by The Institute of Electrical and Electronics Engineers. Inc.
T.P. Smith III, K.Y. Lee, et al.
Physical Review B
H. Baratte, T.N. Jackson, et al.
Applied Physics Letters
Wilfried Haensch, Edward J. Nowak, et al.
IBM J. Res. Dev
E.C. Jones, S. Tiwari, et al.
IEEE International SOI Conference 1998