Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
An intensity analysis is made of the c(2 × 2) LEED pattern of one- to two-layer Mn films on Pd{0 0 1} to see if a theoretically-predicted antiferromagnetic structure contributes to the LEED intensities. We show that a pure magnetic structure, even if buckled, cannot fit the data. However, a mixed, strongly-buckled MnPd surface layer, with the Mn sublayer above the Pd sublayer, gives a moderately good fit. Annealing of the system produces a bulk Pd3Mn alloy with the Cu3Au structure and a buckled relaxed first atomic layer, but with the Mn sublayer now below the Pd sublayer. © 1990.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
John G. Long, Peter C. Searson, et al.
JES
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992