Phillip Chin, Charles A. Zukowski, et al.
Integration, the VLSI Journal
Most existing power gating structures provide only one power-saving mode. We propose a novel power gating structure that supports both a cutoff mode and an intermediate power-saving and data-retaining mode. Experiments with test structures fabricated in 0.13-μm CMOS bulk technology show that our power gating structure yields an expanded design space with more power-performance tradeoff alternatives. © 2007, IEEE. All Rights Reserved.
Phillip Chin, Charles A. Zukowski, et al.
Integration, the VLSI Journal
Suhwan Kim, Conrad H. Ziesler, et al.
Proceedings - Design Automation Conference
Suhwan Kim, Chang Jun Choi, et al.
IEEE Transactions on Electron Devices
Suhwan Kim, Conrad H. Ziesler
IEEE Design and Test of Computers