Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Paper
A note on minimal covers for sofic systems
Abstract
We characterize the sofic systems which have minimal subshift-of-fimtetype covers and derive some consequences. © 1985 American Mathematical Society.
Related
A. Skumanich
SPIE OE/LASE 1992
Yixiong Chen, Weichuan Fang
Engineering Analysis with Boundary Elements
W.C. Tang, H. Rosen, et al.
SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering 1991