Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Paper
A note on the application of the stress dependency of wear in the wear analysis of an electrical contact
Abstract
No abstract available.
Related
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007