Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
The running solutions and I-V characteristic of an extended Josephson junction in a state near the ohmic regime are calculated by a perturbation method. Both the voltage-driven and current-driven cases are considered and the convergence of the perturbation procedure is proved. An integral representation of the first correction, in the I-V curve, to the ohmic regime-as well as its dependence on the external magnetic field-is given and evaluated numerically for various values of the junction parameters. © 1979.
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
James Lee Hafner
Journal of Number Theory
A. Skumanich
SPIE OE/LASE 1992
Charles A Micchelli
Journal of Approximation Theory