Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Paper
A proof of the convexity of the range of a nonatomic vector measure using linear inequalities
Abstract
This note shows how a standard result about linear inequality systems can be used to give a simple proof of the fact that the range of a nonatomic vector measure is convex, a result that is due to Liapounoff. © 1994.
Related
Yi Zhou, Parikshit Ram, et al.
ICLR 2023
Naga Ayachitula, Melissa Buco, et al.
SCC 2007
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998