C. Narayan, S. Purushothaman, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
Electron diffraction patterns generated from phases that have low crystallographic symmetry are difficult and tedious to analyze by conventional techniques. This paper describes a computation scheme that can index electron diffraction patterns efficiently and quickly and be easily implemented on a personal computer. The technique is based on sorting and searching and is especially useful when rapid analyses of electron diffraction patterns are necessary and the crystalline phase under study has a low symmetry. Copyright © 1986 Wiley‐Liss, Inc.
C. Narayan, S. Purushothaman, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
W.R. Tonti, J.A. Fifield, et al.
IRPS 2004
Da-Yuan Shih, Helen L. Yeh, et al.
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
W.Ri. Tont, J.A. Fifield, et al.
IIRW 2003