Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We describe a metal base transistor structure using amorphous silicon prepared from a silane glow discharge. We give some of the operating characteristics and evidence for true injection. The highest measured injection ratio was 8%. We discuss the reasons for the low injection ratios and suggest some improvements. © 1978.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Ming L. Yu
Physical Review B
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
R. Ghez, J.S. Lew
Journal of Crystal Growth