Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Several combinatorial structures exhibit a duality relation that yields interesting theorems, and, sometimes, useful explanations or interpretations of results that do not concern duality explicitly. We present a common characterization of the duality relations associated with matroids, clutters (Sperner families), oriented matroids, and weakly oriented matroids. The same conditions characterize the orthogonality relation on certain families of vector spaces. This leads to a notion of abstract duality. © 2007 Elsevier Ltd. All rights reserved.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Minghong Fang, Zifan Zhang, et al.
CCS 2024
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering