A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
For the interpretation of atomic- and molecular-beam diffraction experiments, it is necessary to be able to calculate scattering intensities for given surface corrugations and scattering geometries correctly and efficiently. We present here a new iterative method, based on the hard-wall approximation, which has the advantages of programming simplicity, accuracy, and the avoidance of matrix inversions. © 1982.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
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