O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Paper
Angular dependence of the leed spectrum of AI (001)
Abstract
No abstract available.
Related
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
R.W. Gammon, E. Courtens, et al.
Physical Review B