Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Apparent soft mode linewidth divergence in PbTiO3
Abstract
The apparent soft mode linewidth divergence observed in Raman scattering from PbTiO3 in the vicinity of the transition temperature is explained by an enhancement of scattering processes that are allowed due to finite acoustic phonon lifetimes. © 1972.
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