Zhiguo Li, Jorma Toppari, et al.
AMIA Annual Symposium 2021
Atomic beam diffraction has become a powerful tool for surface structural investigations. The requirements for an apparatus capable of atomic diffraction under UHV conditions are discussed and the theoretical framework necessary for quantitative analysis of diffraction data is outlined. Recent results obtained on ionic crystals, semiconductors, metals and adsorbate-covered surfaces are reviewed. © 1980.
Zhiguo Li, Jorma Toppari, et al.
AMIA Annual Symposium 2021
A.E. Ruehli, N. Kulasza, et al.
IEEE T-MTT
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EMNLP 2024