Peter J. Price
Surface Science
Paper
Atomic-force microscopy
Abstract
Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.
Related
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001