M.D. 'Iorio, U. Glaus, et al.
Solid State Communications
Paper
Atomic resolution with atomic force microscope
Abstract
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
Related
M. Despont, H. Takahashi, et al.
MEMS 2000
H. Müller-Krumbhaar, E. Stoll
The Journal of Chemical Physics
J. Mannhart, H. Hilgenkamp, et al.
Physical Review Letters