Performance measurement and data base design
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Bugs, especially those in concurrent systems, are often hard to reproduce because they manifest only under rare conditions. Testers frequently encounter failures that occur only under specific inputs, often at low probability. We propose an approach to systematically amplify the occurrence of such elusive bugs. We treat the system under test as a black-box system and use repeated trial executions to train a predictive model that estimates the probability of a given input configuration triggering a bug. We evaluate this approach on a dataset of 17 representative concurrency bugs spanning diverse categories. Several model-based search techniques are compared against a brute-force random sampling baseline. Our results show that an ensemble stacking classifier can significantly increase bug occurrence rates across nearly all scenarios, often achieving an order-of-magnitude improvement over random sampling. The contributions of this work include the following: (i) a novel formulation of bug amplification as a rare-event classification problem; (ii) an empirical evaluation of multiple techniques for amplifying bug occurrence, demonstrating the effectiveness of model-guided search; and (iii) a practical, non-invasive testing framework that helps practitioners to expose hidden concurrency faults without altering the internal system architecture.
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Marshall W. Bern, Howard J. Karloff, et al.
Theoretical Computer Science
Xiaozhu Kang, Hui Zhang, et al.
ICWS 2008
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004