R.V. Joshi, D.A. Smith, et al.
Thin Solid Films
Paper
Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions
Abstract
The capacitance of Nb-oxide-Pb Josephson tunnel junctions was determined from the self-resonance phenomenon in the Josephson.
Related
Masanori Murakami, W.H. Price, et al.
Journal of Applied Physics
Conference paper
Submicron high performance bipolar technology
T.C. Chen, J.D. Cressler, et al.
VLSI Technology 1989
S. Basavaiah, J.H. Greiner
Journal of Applied Physics