TEMPERATURE DEPENDENCE OF STRESSES IN Ti, Cr, AND Cu THIN FILMS.
C.-K. Hu, D. Gupta, et al.
VMIC 1984
The diffusion of Ni63 has been measured in YBa2Cu3O7- epitaxial thin films on (100) SrTiO3 substrates in the 550-650°C range (orthorhombic phase) in O2 pressure of 1 bar, keeping in the 0.3-0.4 range. The diffusion behavior is described by D=1.3 exp[(-2.7 eV)/kT] cm2/sec and is many orders of magnitude slower than anion (oxygen) diffusion reported in the literature. A diffusion mechanism involving thermal vacancies and atomic jumps in diagonal directions of the type 110, 301, and 031 is proposed for long-range diffusion of cations occupying the Cu sites. © 1990 The American Physical Society.
C.-K. Hu, D. Gupta, et al.
VMIC 1984
J.M. Eldridge, R.B. Laibowitz, et al.
Journal of Applied Physics
R.B. Laibowitz, E.I. Alessandrini, et al.
Physical Review B
J.L. Liotard, D. Gupta, et al.
Journal of Applied Physics