J.-M. Halbout, G. Arjavalingam, et al.
LEOS 1990
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
J.-M. Halbout, G. Arjavalingam, et al.
LEOS 1990
I.M. Elfadel, A. Deutsch, et al.
DATE 2004
S.Y. Lin, G. Arjavalingam
Journal of the Optical Society of America B: Optical Physics
G. Arjavalingam, Michael A. Russak, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films