A. Deutsch, T.-M. Winkel, et al.
IEEE Topical Meeting EPEPS 2003
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
A. Deutsch, T.-M. Winkel, et al.
IEEE Topical Meeting EPEPS 2003
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2005
M. Blumrich, D. Chen, et al.
IWIA 2006
G. Almasi, G. Almasi, et al.
Digest of Technical Papers - IEEE International Solid-State Circuits Conference