R. Ghez, M.B. Small
JES
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
R. Ghez, M.B. Small
JES
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
J.A. Barker, D. Henderson, et al.
Molecular Physics
Sung Ho Kim, Oun-Ho Park, et al.
Small