Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Paper
Comment on the use of "Kramers-kronig analysis for the determination of the optical constants of thin surface films" by K. Naegele and W.J. Plieth
Abstract
No abstract available.
Related
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT