Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained from measuring shifts of the resonance frequency, which provides information on conservative interactions, and of the Q-factor, which is sensitive to dissipative interactions. Problems associated with interaction sensing are discussed from a theoretical and an experimental point of view.
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
T. Schneider, E. Stoll
Physical Review B