Zhihua Xiong, Yixin Xu, et al.
International Journal of Modelling, Identification and Control
No abstract available.
Zhihua Xiong, Yixin Xu, et al.
International Journal of Modelling, Identification and Control
Amir Ali Ahmadi, Raphaël M. Jungers, et al.
SICON
Fausto Bernardini, Holly Rushmeier
Proceedings of SPIE - The International Society for Optical Engineering
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004