Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
No abstract available.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures