Defining the "random" spectrum as used in the channeling technique of nuclear backscattering

A new method is described for operationally defining a "random" spectrum as used in channeling studies of nuclear backscattering. The method is reproducible to 1%. A detailed analysis is made for the case of He4 ions backscattered from silicon crystals. Corrections are determined so the "random" spectrum approximates that from an amorphous layer to within ± 1%. © 1972 The American Institute of Physics.