Conference paper
Development of stacking faults in strained silicon layers
S.W. Bedell, A. Reznicek, et al.
IEEE International SOI Conference 2005
Evidence is presented to show that the degradation of near-band-gap photoluminescence emission in GaAs with time of exposure to low power, cw laser excitation can be attributed to a surface mechanism that is independent of surface oxidation and may involve an interaction between crystal point defects and the photogenerated electron-hole plasma near the surface.
S.W. Bedell, A. Reznicek, et al.
IEEE International SOI Conference 2005
G.W. Mulvey, B.K. Ko, et al.
IEEE T-ED
D. Guidotti, E. Hasan, et al.
Il Nuovo Cimento D
Yih-Cheng Shih, A.C. Callegari, et al.
Journal of Applied Physics