A. Krol, C.J. Sher, et al.
Surface Science
A diamond anvil optical cell is employed to measure the pressure dependence of the fundamental indirect Γ-X transition of crystalline Si. The result is E (eV) = (1.110 ± 0.002) - (1.41 ± 0.06) × 10-3P where the pressure P is in kbar. Between 115 and 126 a transformation takes place to a phase opaque to electromagnetic radiation of wavelength between 0.3 and 2.0 μm. We believe this is the same phase transition reported by Minomura and Drickamer. A pseudopotential calculation assuming a relatively soft core is carried out and its results are in rather good agreement with experiment. © 1975.
A. Krol, C.J. Sher, et al.
Surface Science
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Revanth Kodoru, Atanu Saha, et al.
arXiv
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures