Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

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Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

Paper

Limits to Jitter in Digital CMOS Gates

Keith A. Jenkins

IEEE SSC-L

Paper

Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substrates

Joachim N. Burghartz, Daniel C. Edelstein, et al.

IEEE T-MTT

Conference paper

High-frequency performance of graphene field effect transistors with saturating IV-characteristics

Inanc Meric, Cory R. Dean, et al.

IEDM 2011

Paper

AC device variability in high-κ Metal-Gate CMOS Technology

Keith A. Jenkins, Karthik Balakrishnan, et al.

IEEE Electron Device Letters

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Abstract

Related

Limits to Jitter in Digital CMOS Gates

Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substrates

High-frequency performance of graphene field effect transistors with saturating IV-characteristics

AC device variability in high-κ Metal-Gate CMOS Technology