Walter H. Henkels, Nicky C. C. Lu, et al.
IEEE T-ED
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Walter H. Henkels, Nicky C. C. Lu, et al.
IEEE T-ED
Keith A. Jenkins, Alan J. Weger
IEEE Electron Device Letters
Yu-Ming Lin, Alberto Valdes-Garcia, et al.
Science
Yanqing Wu, Yu-Ming Lin, et al.
IEDM 2010