Conference paper
A circuit-sensitive methodology for evaluating substrate noise
John Liobe, Keith A. Jenkins
RFIC 2005
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
John Liobe, Keith A. Jenkins
RFIC 2005
Shu-Jen Han, Satoshi Oida, et al.
IEEE Electron Device Letters
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Shu Jen Han, Alberto Valdes Garcia, et al.
Nature Communications