D. Gupta, K.W. Asai
Thin Solid Films
Diffusion of Ag110m radioactive tracer has been measured in amorphous Pd-19-at.%-Si specimens characterized by a Seeman-Bohlin x-ray diffractometer. The diffusion parameters in this metallic amorphous phase have been found to have a regime distinctly different from liquid and crystalline phases. © 1975 The American Physical Society.
D. Gupta, K.W. Asai
Thin Solid Films
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Physical Review B
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Applied Physics Letters
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