H.D. Dulman, R.H. Pantell, et al.
Physical Review B
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
J.Z. Sun
Journal of Applied Physics
T.N. Morgan
Semiconductor Science and Technology
Ming L. Yu
Physical Review B