Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Paper

Examining deep holes by rocking the beam in the scanning electron microscope

Oliver C. Wells

Review of Scientific Instruments

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Method for measuring the field from a magnetic recording head in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

Paper

Reduction of edge penetration effect in the scanning electron microscope

Oliver C. Wells

Scanning

View all publications