PaperElectronic effect on the debye temperature of N-type siliconRobert W. Keyes, Nobuyoshi KobayashiSolid State Communications
PaperSpecial Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. KeyesIEEE JSSC
PaperTransmitted Phonon Drag Effect in Germanium at Very Low TemperaturesEdward J. Walker, Robert W. KeyesPhysical Review Letters