IEEE Design and Test of Computers

Paper

01 Jan 1990

Dynamic statistical control of manufacturing test

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Abstract

No abstract available.

Conference paper

Statistical data reduction lor manufacturing testing

Sakti P. Ghosh

ICDE 1986

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Consecutive Storage of Relevant Records with Redundancy

Sakti P. Ghosh

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Statistical Relational Databases: Normal Forms

Sakti P. Ghosh

IEEE TKDE

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File Organization: The Consecutive Retrieval Property

Sakti P. Ghosh

CACM

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