J.H. Stathis, R. Bolam, et al.
INFOS 2005
Self-diffusion measurements have been made in polycrystalline Au-1.2 at.% Ta alloy over the temperature range 204°-395.5 °C using 195Au radioactive tracer and r.f. backsputtering techniques for serial sectioning. Self-diffusion coefficients were obtained in the lattice, dislocation networks (subgrains) and large angle grain boundaries and these yielded Arrhenius parameters for the three diffusion processes. A small addition of Ta to Au was found to have profound effects on Au diffusion in the lattice and along grain boundaries. © 1975.
J.H. Stathis, R. Bolam, et al.
INFOS 2005
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Robert W. Keyes
Physical Review B
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010