J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Injection laser lifetime data are subjected to a simple screening test to identify the longer lived units. The effect this has on the lifetime distribution, and in particular, on the reliability of a system composed of a set of these lasers is considered. © 1980 IEEE
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Frank Stem
C R C Critical Reviews in Solid State Sciences
P.C. Pattnaik, D.M. Newns
Physical Review B