Review

09 Aug 2011

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

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Abstract

No abstract available.

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

Scanning

Paper

Low-loss image for surface scanning electron microscope

Oliver C. Wells

Applied Physics Letters

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

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