W.P. Dumke, J. Woodall, et al.
Solid-State Electronics
The light-emitting diodes described in this Letter differ from standard type diodes insofar as the amphoteric dopant Si is the dominant impurity on both sides of the junction. The p-n junction is completely solution regrown. The highly compensated p region gives rise to a wide active region up to 50 μ in width. The interesting feature of these diodes is their high external quantum efficiencies at 300°K. Values up to 6% have been measured on diodes, when an antireflecting coat has been applied. © 1966 The American Institute of Physics.
W.P. Dumke, J. Woodall, et al.
Solid-State Electronics
E.A. Fitzgerald, G.P. Watson, et al.
Journal of Applied Physics
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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.C. Gee, C.L. Lin, et al.
Electronics Letters