Federico Panciera, Jerry Tersoff, et al.
Advanced Materials
No abstract available.
Federico Panciera, Jerry Tersoff, et al.
Advanced Materials
Nicholas M. Schneider, Jeung Hun Park, et al.
Microscopy and Microanalysis
B. Wacaser, Maha M. Khayyat, et al.
PVSC 2010
See Wee Chee, Martin Kammler, et al.
Ultramicroscopy