Frank Stem
C R C Critical Reviews in Solid State Sciences
This paper presents a review of electron‐sensitive resists evaluated for electron beam exposure. This includes positive as well as negative resists and their relative merits and drawbacks. The paper also presents general guidelines that can be used in evaluating any electron resist system for performance and usefulness in electron beam microfabrication. Copyright © 1974 Society of Plastics Engineers, Inc.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics