S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Direct experimental evidence for the existence of electron-hole drops in Si has been obtained from the current pulses produced when they dissociate in the high electric field of a p-n junction. From these results we also determine the drop radius, which is typically about 0.75 μ in this experiment. © 1975.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Ming L. Yu
Physical Review B
Robert W. Keyes
Physical Review B