A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Paper
Electronic effect on the debye temperature of N-type silicon
Abstract
Analysis of recently published measurements of the specific heat of heavily doped n-type silicon reveals a dependence of the Debye temperature on doping. © 1978.
Related
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Peter J. Price
Surface Science
Conference paper
Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989