O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Results are presented detailing the crystallographic quality of a number of metal films deposited by epitaxial sputter deposition. Such films have single-orientation f.c.c., h.c.p., b.c.c. and hybrid crystal structures, and include the elements Ag, Au, Co, Cr, Cu, Fe, Rh, Ru, Pd and V. The crystal structure was characterized using X-ray diffraction analysis.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
J.H. Stathis, R. Bolam, et al.
INFOS 2005