Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Paper
Estimation of the Shape and Scale Parameters of the Weibull Distribution
Abstract
No abstract available.
Related
Zhihua Xiong, Yixin Xu, et al.
International Journal of Modelling, Identification and Control
Conference paper
Channel coding considerations for wireless LANs
Daniel J. Costello Jr., Pierre R. Chevillat, et al.
ISIT 1997
Chai Wah Wu
Linear Algebra and Its Applications