IEEE Circuits and Devices Magazine

Paper

01 Sep 2002

Explaining strain

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Abstract

No abstract available.

Paper

Specific heat of silicon in the millidegree region

Robert W. Keyes

Physical Review B

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Heat Transfer in Forced Convection Through Fins

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IEEE T-ED

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The effect of randomness in the distribution of impurity atoms on FET thresholds

Robert W. Keyes

Applied Physics

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Two-level systems in the mechanical properties of silicon at low temperatures

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Physical Review Letters

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