Appl Stochastic Models Bus Indus

Editorial

27 Apr 2020

Foreword: Special issue on statistics in quality, industry, and technology

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Paper

Foreword: Special issue on statistics in quality and productivity

Michael Baron, Emmanuel Yashchin

Appl Stochastic Models Bus Indus

Conference paper

Minimum void size and 3-parameter lognormal distribution for em failures in Cu interconnects

Baozhen Li, Cathryn Christiansen, et al.

IRPS 2006

Paper

Weighted cumulative sum technique

Emmanuel Yashchin

Technometrics

Conference paper

Computational and Monte-Carlo aspects of systems for monitoring reliability data

Emmanuel Yashchin

COMPSTAT 2010

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