Appl Stochastic Models Bus Indus

Editorial

27 Apr 2020

Foreword: Special issue on statistics in quality, industry, and technology

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Paper

Application of three-parameter lognormal distribution in EM data analysis

Baozhen Li, Emmanuel Yashchin, et al.

Microelectronics Reliability

Conference paper

Min-log approach to modeling dielectric breakdown data

Emmanuel Yashchin, Baozhen Li, et al.

IRPS 2012

Paper

Monitoring variance components

Emmanuel Yashchin

Technometrics

Paper

Estimating the current mean of a process subject to abrupt changes

Emmanuel Yashchin

Technometrics

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