T.P. Smith III, K.Y. Lee, et al.
Physical Review B
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
T.P. Smith III, K.Y. Lee, et al.
Physical Review B
K.Y. Lee, N. LaBianca, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
S. Washburn, K. Ismail, et al.
Quantum Effect Physics, Electronics and Applications 1992
D.P. Halliday, J.M. Eggleston, et al.
Solid State Communications