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Technical Digest-International Electron Devices Meeting
We report results of photoluminescence measurements in high purity n- and p-type GaAs at low temperatures which substantiate the identification of the 1.5133 eV emission line with the recombination of free valence band holes with electrons bound to shallow donors. © 1974.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
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Journal of Rheology
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
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Surface Review and Letters