Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
This paper compares the major classes of chip-to-chip and on-chips interconnections used in high-performance computers and communication systems and reviews their electrical characteristics. Measurement results of dielectric loss are shown and the attenuation is compared for printed-circuit-board, glass-ceramic, thin-film, and on-chip wiring. Simulation results are shown with representative driver and receiver circuits, guide-lines are given for when losses are significant, and predictions are made for the sustainable bandwidths on useful wiring lengths.
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
Revanth Kodoru, Atanu Saha, et al.
arXiv