Microscopy and Microanalysis

Paper

24 Jul 2003

High resolution spectrometer coupling to the sub-Å IBM STEM

Abstract

No abstract available.

Paper

Local bonding and electronic structure obtained from electron energy loss scattering

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Ultramicroscopy

Conference paper

Studies of EELS L_2,3 absorption fine structure in thin silicon

P.E. Batson

Microscopy of Semiconducting Materials 1991

Paper

Effect of arsenic segregation on the electrical properties of grain boundaries in polycrystalline silicon

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Journal of Applied Physics

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Experimental energy-loss function, Im[-1(q,)], for aluminum

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Physical Review B

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